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Naji, M. |
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Motta, Antonella |
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Aletan, Dirar |
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Mohamed, Tarek |
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Ertürk, Emre |
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Taccardi, Nicola |
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Kononenko, Denys |
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Petrov, R. H. | Madrid |
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Alshaaer, Mazen | Brussels |
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Bih, L. |
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Casati, R. |
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Muller, Hermance |
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Kočí, Jan | Prague |
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Šuljagić, Marija |
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Kalteremidou, Kalliopi-Artemi | Brussels |
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Azam, Siraj |
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Ospanova, Alyiya |
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Blanpain, Bart |
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Ali, M. A. |
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Popa, V. |
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Rančić, M. |
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Ollier, Nadège |
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Azevedo, Nuno Monteiro |
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Landes, Michael |
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Rignanese, Gian-Marco |
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Silveira, Marta Gonzalez
in Cooperation with on an Cooperation-Score of 37%
Topics
Publications (9/9 displayed)
- 2018Evidence of thermal transport anisotropy in stable glasses of vapor deposited organic moleculescitations
- 2015Aging and structural relaxation of hyper-quenched Mg<inf>65</inf>Cu<inf>25</inf>Y<inf>10</inf> metallic glasscitations
- 2014Kinetics of silicide formation over a wide range of heating rates spanning six orders of magnitudecitations
- 2013Combinatorial method for direct measurements of the intrinsic hydrogen permeability of separation membrane materialscitations
- 2013Relaxation of rapidly quenched metallic glasses: Effect of the relaxation state on the slow low temperature dynamicscitations
- 2012Atomic-scale relaxation dynamics and aging in a metallic glass probed by X-ray photon correlation spectroscopy
- 2007Time resolved x-ray reflectivity study of interfacial reactions in Cu Mg thin films during heat treatmentcitations
- 2006Influence of layer microstructure on the double nucleation process in Cu/Mg multilayerscitations
- 2003Calorimetric and x-ray analysis of the intermediate phase formation in Cu/Mg multilayerscitations
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article
Calorimetric and x-ray analysis of the intermediate phase formation in Cu/Mg multilayers
Abstract
The calorimetric and x ray analysis of the kinetics of intermediate phase formation in magnesium and copper multilayers was discussed. Three exothermic peaks were observed. The first two reactions related to growth and nucleation of Mg2Cu along the interface. The third process was due to the growth of Mg2Cu perpendicular to the original interface.