Materials Map

Discover the materials research landscape. Find experts, partners, networks.

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The Materials Map is an open tool for improving networking and interdisciplinary exchange within materials research. It enables cross-database search for cooperation and network partners and discovering of the research landscape.

The dashboard provides detailed information about the selected scientist, e.g. publications. The dashboard can be filtered and shows the relationship to co-authors in different diagrams. In addition, a link is provided to find contact information.

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Materials Map under construction

The Materials Map is still under development. In its current state, it is only based on one single data source and, thus, incomplete and contains duplicates. We are working on incorporating new open data sources like ORCID to improve the quality and the timeliness of our data. We will update Materials Map as soon as possible and kindly ask for your patience.

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1.080 Topics available

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693.932 PEOPLE
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in Cooperation with on an Cooperation-Score of 37%

Topics

Publications (4/4 displayed)

  • 2002Far infrared (THz) electroluminescence from Si/SiGe quantum cascade heterostructurescitations
  • 2002Performance of an energy resolving X-ray pixel detector7citations
  • 2001Probing bulk and surface damage in widegap semiconductors11citations
  • 2001Applications of pixellated GaAs X-ray detectors in a synchrotron radiation beam6citations

Places of action

Chart of shared publication
Ikonic, Z.
1 / 13 shared
Arnone, D. D.
1 / 1 shared
Kelsall, R. W.
1 / 2 shared
Norris, D. J.
1 / 1 shared
Paul, D. J.
1 / 3 shared
Lynch, S. A.
1 / 1 shared
Harrison, P.
1 / 16 shared
Pidgeon, Carl
1 / 2 shared
Cullis, A. G.
1 / 4 shared
Passmore, Ms
2 / 3 shared
Prydderch, M.
1 / 2 shared
Seller, P.
1 / 7 shared
Thomas, Sl
1 / 1 shared
Iles, G.
1 / 1 shared
Lowe, B.
1 / 3 shared
Smith, K.
1 / 9 shared
Mathieson, Keith
2 / 10 shared
Derbyshire, G.
1 / 1 shared
Gannon, Wjf
1 / 1 shared
Roy, P.
1 / 7 shared
Smith, K. M.
1 / 2 shared
Mathieson, K.
1 / 1 shared
Watson, Ian
1 / 20 shared
Cunningham, W.
1 / 3 shared
Scott, J.
1 / 2 shared
Lamb, G.
1 / 1 shared
Gouldwell, A.
1 / 1 shared
Cusco, R.
1 / 2 shared
Glaser, M.
1 / 1 shared
Rahman, M.
1 / 12 shared
Mikulec, B.
1 / 1 shared
Oshea, V.
1 / 7 shared
Campbell, M.
1 / 5 shared
Schwarz, C.
1 / 1 shared
Smith, Km
1 / 5 shared
Whitehill, C.
1 / 1 shared
Watt, J.
1 / 1 shared
Chart of publication period
2002
2001

Co-Authors (by relevance)

  • Ikonic, Z.
  • Arnone, D. D.
  • Kelsall, R. W.
  • Norris, D. J.
  • Paul, D. J.
  • Lynch, S. A.
  • Harrison, P.
  • Pidgeon, Carl
  • Cullis, A. G.
  • Passmore, Ms
  • Prydderch, M.
  • Seller, P.
  • Thomas, Sl
  • Iles, G.
  • Lowe, B.
  • Smith, K.
  • Mathieson, Keith
  • Derbyshire, G.
  • Gannon, Wjf
  • Roy, P.
  • Smith, K. M.
  • Mathieson, K.
  • Watson, Ian
  • Cunningham, W.
  • Scott, J.
  • Lamb, G.
  • Gouldwell, A.
  • Cusco, R.
  • Glaser, M.
  • Rahman, M.
  • Mikulec, B.
  • Oshea, V.
  • Campbell, M.
  • Schwarz, C.
  • Smith, Km
  • Whitehill, C.
  • Watt, J.
OrganizationsLocationPeople

article

Performance of an energy resolving X-ray pixel detector

  • Passmore, Ms
  • Prydderch, M.
  • Seller, P.
  • Bates, R.
  • Thomas, Sl
  • Iles, G.
  • Lowe, B.
  • Smith, K.
  • Mathieson, Keith
  • Derbyshire, G.
  • Gannon, Wjf
Abstract

We have built a back-illuminated, silicon X-ray detector with 16×16 pixels. This is bump-bonded to an integrated circuit containing a corresponding array of pre-amplifiers. The bump-bonded unit is wire bonded to two 128 channel integrated circuits which have signal shaping, peak-hold and sparcification logic. These integrated circuits output the analogue value of the individual X-ray and the address of the 300 μm×300 μm pixel. The system has previously demonstrated X-ray spectroscopy measurement in the 5–40 keV range with a resolution of 1 keV FWHM. This paper describes the performance of the system used in an X-ray diffraction experiment performed on the Daresbury Synchrotron Radiation Source. The second part demonstrates the successful operation of this pixellated detector for spectroscopy. In this part, the variation among the pixel outputs is accounted for without significantly affecting the noise performance.

Topics
  • impedance spectroscopy
  • x-ray diffraction
  • experiment
  • Silicon
  • wire
  • X-ray spectroscopy