Materials Map

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The Materials Map is an open tool for improving networking and interdisciplinary exchange within materials research. It enables cross-database search for cooperation and network partners and discovering of the research landscape.

The dashboard provides detailed information about the selected scientist, e.g. publications. The dashboard can be filtered and shows the relationship to co-authors in different diagrams. In addition, a link is provided to find contact information.

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The Materials Map is still under development. In its current state, it is only based on one single data source and, thus, incomplete and contains duplicates. We are working on incorporating new open data sources like ORCID to improve the quality and the timeliness of our data. We will update Materials Map as soon as possible and kindly ask for your patience.

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in Cooperation with on an Cooperation-Score of 37%

Topics

Publications (9/9 displayed)

  • 2012Line defects, planar defects and voids in SrTiO3 films grown on MgO by pulsed laser and pulsed laser interval deposition6citations
  • 2010Microstructural investigation of strontium titanate films grown by interval pulsed laser deposition1citations
  • 2009Two-dimensional growth of SrTiO3 thin films on (001) MgO substrates using pulsed laser deposition and reflection high energy electron diffraction10citations
  • 2009Comparison of structural, microstructural, and electrical analyses of barium strontium titanate thin films4citations
  • 2008Growth and Microstructural Studies of Strontium Titanate Films Grown by Standard and Interval Pulsed Laser Deposition6citations
  • 2007Microstructural study of a YBCO multilayer coated conductor cylinder9citations
  • 2006Microstructure of Homeoepitaxial SrTiO₃ Thin Films Grown by Laser Ablation13citations
  • 2006Temperature Dependent Dielectric Properties of Coplanar Phase Shifters Fabricated from Ba₀.₅SR₀.₅Ti0₃ Thin Films5citations
  • 2006Microwave and Microstructural Properties of Ba₀.₅Sr₀.₅TiO₃ of Thin Film Coplanar Phase Shifters53citations

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Chart of shared publication
Mcmitchell, Src
3 / 3 shared
Genc, A.
2 / 4 shared
Jackson, Timothy
8 / 12 shared
Jones, Ian
8 / 58 shared
Lancaster, Mj
4 / 24 shared
Bouyanfif, H.
2 / 8 shared
Marssi, M. El
1 / 4 shared
Hriljac, Joseph, A.
1 / 17 shared
Suherman, Pm
1 / 1 shared
Liu, Ying
1 / 6 shared
Mcmitchell, Sean
1 / 1 shared
Abell, John
1 / 3 shared
Maher, Ef
1 / 1 shared
Cheung, Yim
1 / 1 shared
Passerieux, G.
1 / 2 shared
Koutsonas, Ioannis
1 / 1 shared
Suherman, Phe
2 / 3 shared
Chakalova, Radka
1 / 3 shared
Porch, A.
1 / 4 shared
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2012
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Co-Authors (by relevance)

  • Mcmitchell, Src
  • Genc, A.
  • Jackson, Timothy
  • Jones, Ian
  • Lancaster, Mj
  • Bouyanfif, H.
  • Marssi, M. El
  • Hriljac, Joseph, A.
  • Suherman, Pm
  • Liu, Ying
  • Mcmitchell, Sean
  • Abell, John
  • Maher, Ef
  • Cheung, Yim
  • Passerieux, G.
  • Koutsonas, Ioannis
  • Suherman, Phe
  • Chakalova, Radka
  • Porch, A.
OrganizationsLocationPeople

article

Line defects, planar defects and voids in SrTiO3 films grown on MgO by pulsed laser and pulsed laser interval deposition

  • Mcmitchell, Src
  • Genc, A.
  • Jackson, Timothy
  • Tse, Yau
  • Jones, Ian
Abstract

Two and three dimensional growth of SrTiO3 films on (001) MgO substrate was achieved by pulsed laser interval and pulsed laser deposition respectively. The growth mode was monitored by in-situ reflection high energy electron diffraction. Interval deposition forces layer-by-layer growth of materials even with such a large lattice misfit (similar to 7.9%). A titanium dioxide buffer monolayer was deposited to allow the film to wet the substrate to encourage two dimensional growth of the strontium titanate. A variety of defects was investigated using transmission electron microscopy and high resolution scanning transmission electron microscopy. Misfit dislocations, steps at the interface, Ti-rich defects and regularly shaped nano-holes connected by anti-phase boundaries were found to be the dominant defects in these films grown layer by layer. The edges of the nano-holes were mainly along [010] and 1100] for a [001] growth direction. The large strain between the two crystal systems with large lattice mismatch leads to in-plane tensile stress during the layer-by-layer growth. The stress is relieved in part by the holes. The films with a three dimensional growth mode possess a uniform surface with dislocations as the dominant defects. The individual densities of the various defects, including a Ti-rich phase and misfit and threading dislocations, are determined by the kinetics of the deposition method. (C) 2011 Elsevier B.V. All rights reserved.

Topics
  • impedance spectroscopy
  • surface
  • phase
  • Strontium
  • transmission electron microscopy
  • dislocation
  • titanium
  • void
  • pulsed laser deposition
  • high energy electron diffraction