| People | Locations | Statistics |
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| Naji, M. |
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| Motta, Antonella |
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| Aletan, Dirar |
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| Mohamed, Tarek |
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| Ertürk, Emre |
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| Taccardi, Nicola |
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| Kononenko, Denys |
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| Petrov, R. H. | Madrid |
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| Alshaaer, Mazen | Brussels |
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| Bih, L. |
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| Casati, R. |
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| Muller, Hermance |
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| Kočí, Jan | Prague |
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| Šuljagić, Marija |
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| Kalteremidou, Kalliopi-Artemi | Brussels |
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| Azam, Siraj |
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| Ospanova, Alyiya |
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| Blanpain, Bart |
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| Ali, M. A. |
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| Popa, V. |
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| Rančić, M. |
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| Ollier, Nadège |
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| Azevedo, Nuno Monteiro |
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| Landes, Michael |
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| Rignanese, Gian-Marco |
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Spolenak, R.
in Cooperation with on an Cooperation-Score of 37%
Topics
Publications (13/13 displayed)
- 2017Investigation of the deformation behavior of aluminum micropillars produced by focused ion beam machining using Ga and Xe ionscitations
- 2015Improved contact damage resistance of hydrogenated diamond-like carbon (DLC) with a ductile α-Ta interlayercitations
- 2015The Hidden Pathways in Dense Energy Materials - Oxygen at Defects in Nanocrystalline Metalscitations
- 2015Cohesive and adhesive failure of hard and brittle films on ductile metallic substrates: a film thickness size effect analysis of the model system hydrogenated diamond-like carbon (a-C:H) on Ti substratescitations
- 2015Contact damage of hard and brittle thin films on ductile metallic substrates: an analysis of diamond-like carbon on titanium substratescitations
- 2014On the peculiar deformation mechanism of ion-induced texture rotation in thin filmscitations
- 2013Magnetron sputter deposited tantalum and tantalum nitride thin films: an analysis of phase, hardness and compositioncitations
- 2010In situ Elastic Strain Measurements-Diffraction and Spectroscopy
- 2010In situ Elastic Strain Measurements-Diffraction and Spectroscopy
- 2010In situ elastic strain measurements - diffraction and spectroscopycitations
- 2008Large area arrays of metal nanowirescitations
- 2007Investigation of dealloying in Au-Ag thin films by quantitative electron probe microanalysiscitations
- 2005Reversible orientation-biased grain growth in thin metal films induced by a focused ion beamcitations
Places of action
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article
Investigation of the deformation behavior of aluminum micropillars produced by focused ion beam machining using Ga and Xe ions
Abstract
Sample geometries for micro-mechanical testing, e.g. micro-pillars and micro-cantilevers are primarily produced using gallium focused ion beam technology. However, the effects of the gallium ions on the mechanical properties of metals which are embrittled by liquid metal gallium are still unknown. In this work, micro-compression samples from single crystalline and ultrafine-grained aluminum are fabricated using both xenon and/or gallium ions. The different ions have little effect on the yield strength of single crystalline aluminum. However, for the ultrafine-grained aluminum, the strength is reduced with increasing Ga dose, and considerable differences in the deformation morphology and resulting microstructures are observed.