Materials Map

Discover the materials research landscape. Find experts, partners, networks.

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The Materials Map is an open tool for improving networking and interdisciplinary exchange within materials research. It enables cross-database search for cooperation and network partners and discovering of the research landscape.

The dashboard provides detailed information about the selected scientist, e.g. publications. The dashboard can be filtered and shows the relationship to co-authors in different diagrams. In addition, a link is provided to find contact information.

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Materials Map under construction

The Materials Map is still under development. In its current state, it is only based on one single data source and, thus, incomplete and contains duplicates. We are working on incorporating new open data sources like ORCID to improve the quality and the timeliness of our data. We will update Materials Map as soon as possible and kindly ask for your patience.

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in Cooperation with on an Cooperation-Score of 37%

Topics

Publications (1/1 displayed)

  • 2009AlN on nanocrystalline diamond piezoelectric cantilevers for sensors/actuators9citations

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Chart of shared publication
Haenen, K.
1 / 5 shared
Pernod, Philippe
1 / 26 shared
Jaeger, Jean-Claude De
1 / 4 shared
Talbi, Abdelkrim
1 / 13 shared
Soltani, A.
1 / 6 shared
Wagner, P.
1 / 10 shared
Mortet, V.
1 / 11 shared
Chart of publication period
2009

Co-Authors (by relevance)

  • Haenen, K.
  • Pernod, Philippe
  • Jaeger, Jean-Claude De
  • Talbi, Abdelkrim
  • Soltani, A.
  • Wagner, P.
  • Mortet, V.
OrganizationsLocationPeople

document

AlN on nanocrystalline diamond piezoelectric cantilevers for sensors/actuators

  • Pobedinskas, P.
  • Haenen, K.
  • Pernod, Philippe
  • Jaeger, Jean-Claude De
  • Talbi, Abdelkrim
  • Soltani, A.
  • Wagner, P.
  • Mortet, V.
Abstract

Micro-cantilevers can be used as both sensors and actuators. In this work, the design, fabrication and characterization of piezoelectrically driven nano-crystalline diamond (NCD) cantilevers are reported Diamond films were grown on silicon (100) substrates by microwave plasma enhanced chemical vapor deposition (MW-PECVD). Cantilevers are coated by DC pulsed piezoelectric with AlN films that is sandwiched between two metallic electrodes. The thicknesses of AlN and diamond layers are 1μm and 700nm, respectively. The influence on the electromechanical response of cantilevers length was studied. The motion of the electrically driven cantilevers is performed by measuring the evolution of the electrical impedance at the resonant frequencies that varies between 10 kHz and 130 kHz for the resonant mode.

Topics
  • impedance spectroscopy
  • Silicon
  • chemical vapor deposition