Materials Map

Discover the materials research landscape. Find experts, partners, networks.

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The Materials Map is an open tool for improving networking and interdisciplinary exchange within materials research. It enables cross-database search for cooperation and network partners and discovering of the research landscape.

The dashboard provides detailed information about the selected scientist, e.g. publications. The dashboard can be filtered and shows the relationship to co-authors in different diagrams. In addition, a link is provided to find contact information.

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Materials Map under construction

The Materials Map is still under development. In its current state, it is only based on one single data source and, thus, incomplete and contains duplicates. We are working on incorporating new open data sources like ORCID to improve the quality and the timeliness of our data. We will update Materials Map as soon as possible and kindly ask for your patience.

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1.080 Topics available

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977 Locations available

693.932 PEOPLE
693.932 People People

693.932 People

Show results for 693.932 people that are selected by your search filters.

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Radfar, Behrad

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Aalto University

in Cooperation with on an Cooperation-Score of 37%

Topics

Publications (9/9 displayed)

  • 2024(invited talk) Sulfur-hyperdoped silicon by ultrashort laser processingcitations
  • 2024Development of a Selective Wet-Chemical Etchant for Precise 3D Sculpting of Silicon Enabled by Infrared Non-Linear Laser Modification1citations
  • 2024Impact of post-ion implantation annealing on Se-hyperdoped Ge1citations
  • 2024Impact of post-ion implantation annealing on Se-hyperdoped Ge1citations
  • 2024Bridging the gap between surface physics and photonics2citations
  • 2023(oral talk) Effective carrier lifetime in ultrashort pulse laser hyperdoped silicon: dopant concentration dependence and practical upper limitscitations
  • 2023Excellent Responsivity and Low Dark Current Obtained with Metal-Assisted Chemical Etched Si Photodiode4citations
  • 2022Perspectives on Black Silicon in Semiconductor Manufacturing: Experimental Comparison of Plasma Etching, MACE and Fs-Laser Etching32citations
  • 2022Millisecond-Level Minority Carrier Lifetime in Femtosecond Laser-Textured Black Silicon11citations

Places of action

Chart of shared publication
Seibt, Michael
1 / 14 shared
Savin, Hele
8 / 75 shared
Paulus, Simon
2 / 3 shared
Liu, Xiaolong
8 / 13 shared
Niemeyer, Tobias
1 / 1 shared
Schäfer, Sören
4 / 6 shared
Koskinen, Vesa
1 / 1 shared
Vähänissi, Ville
8 / 43 shared
Kontermann, Stefan
4 / 8 shared
Kearney, Patrick Mc
3 / 3 shared
Mutschall, Doris
1 / 2 shared
Serue, Michael
2 / 2 shared
Pavlov, Ihor
1 / 2 shared
Turan, Raşit
1 / 2 shared
Borra, Mona Zolfaghari
1 / 1 shared
İlday, Fatih Ömer
1 / 1 shared
Toffoli, Daniele
1 / 4 shared
Nasser, Hisham
1 / 1 shared
Çolakoğlu, Tahir
1 / 1 shared
Bek, Alpan
1 / 1 shared
Üstünel, Hande
1 / 1 shared
Tokel, Onur
1 / 1 shared
Turnalı, Ahmet
1 / 1 shared
Demirtaş, Merve
1 / 1 shared
Taşgın, Dilek Işık
1 / 1 shared
Berencen, Yonder
2 / 4 shared
Kentsch, Ulrich
2 / 7 shared
Zhou, Shengqiang
2 / 15 shared
Mc Kearney, Patrick
1 / 2 shared
Punkkinen, Marko
1 / 6 shared
Kuzmin, Mikhail
1 / 10 shared
Kokko, Kalevi
1 / 10 shared
Hakkarainen, Teemu
1 / 5 shared
Viheriälä, Jukka
1 / 2 shared
Guina, Mircea
1 / 36 shared
Tukiainen, Antti
1 / 23 shared
Laukkanen, Pekka
1 / 11 shared
Setälä, Olli E.
2 / 4 shared
Pasanen, Toni P.
3 / 21 shared
Heinonen, Juha
1 / 2 shared
Chen, Kexun
3 / 7 shared
Yli-Koski, Marko
1 / 7 shared
Pälikkö, Elmeri
1 / 1 shared
Chart of publication period
2024
2023
2022

Co-Authors (by relevance)

  • Seibt, Michael
  • Savin, Hele
  • Paulus, Simon
  • Liu, Xiaolong
  • Niemeyer, Tobias
  • Schäfer, Sören
  • Koskinen, Vesa
  • Vähänissi, Ville
  • Kontermann, Stefan
  • Kearney, Patrick Mc
  • Mutschall, Doris
  • Serue, Michael
  • Pavlov, Ihor
  • Turan, Raşit
  • Borra, Mona Zolfaghari
  • İlday, Fatih Ömer
  • Toffoli, Daniele
  • Nasser, Hisham
  • Çolakoğlu, Tahir
  • Bek, Alpan
  • Üstünel, Hande
  • Tokel, Onur
  • Turnalı, Ahmet
  • Demirtaş, Merve
  • Taşgın, Dilek Işık
  • Berencen, Yonder
  • Kentsch, Ulrich
  • Zhou, Shengqiang
  • Mc Kearney, Patrick
  • Punkkinen, Marko
  • Kuzmin, Mikhail
  • Kokko, Kalevi
  • Hakkarainen, Teemu
  • Viheriälä, Jukka
  • Guina, Mircea
  • Tukiainen, Antti
  • Laukkanen, Pekka
  • Setälä, Olli E.
  • Pasanen, Toni P.
  • Heinonen, Juha
  • Chen, Kexun
  • Yli-Koski, Marko
  • Pälikkö, Elmeri
OrganizationsLocationPeople

article

Development of a Selective Wet-Chemical Etchant for Precise 3D Sculpting of Silicon Enabled by Infrared Non-Linear Laser Modification

  • Pavlov, Ihor
  • Turan, Raşit
  • Borra, Mona Zolfaghari
  • Radfar, Behrad
  • İlday, Fatih Ömer
  • Toffoli, Daniele
  • Nasser, Hisham
  • Çolakoğlu, Tahir
  • Bek, Alpan
  • Üstünel, Hande
  • Tokel, Onur
  • Turnalı, Ahmet
  • Demirtaş, Merve
  • Taşgın, Dilek Işık
Abstract

Recently-demonstrated high-quality three-dimensional (3D) subsurface laser processing inside crystalline silicon (c-Si) wafers opens a door to a wide range of novel applications in multidisciplinary research areas. Using this technique, novel maskless micro-pillars with precise control on the surface reflection and coverage are successfully fabricated by etching the laser processed region of the c-Si wafer. To achieve this, a particular selective wet chemical etching is developed to follow subsurface laser processing of c-Si to reveal the desired 3D structures with smooth surfaces. Here, we report the development of a novel chromium-free chemical etching recipe based on copper nitrate, which yields substantially smooth surfaces at a high etch rate and selectivity on the both laser-processed Si surface and subsurface, i.e., without significant etching of the unmodified Si. Our results show that the etch rate and surface morphology are interrelated and strongly influenced by the composition of the adopted etching solution. After an extensive compositional study performed at room temperature, we identify an etchant with a selectivity of over 1600 times for laser-modified Si with respect to unmodified Si. We also support our findings using density functional theory calculations of HF and Cu adsorption energies, indicating significant diversity on the c-Si and laser-modified surfaces.

Topics
  • density
  • impedance spectroscopy
  • morphology
  • surface
  • chromium
  • theory
  • copper
  • Silicon
  • etching
  • density functional theory