Materials Map

Discover the materials research landscape. Find experts, partners, networks.

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The Materials Map is an open tool for improving networking and interdisciplinary exchange within materials research. It enables cross-database search for cooperation and network partners and discovering of the research landscape.

The dashboard provides detailed information about the selected scientist, e.g. publications. The dashboard can be filtered and shows the relationship to co-authors in different diagrams. In addition, a link is provided to find contact information.

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Materials Map under construction

The Materials Map is still under development. In its current state, it is only based on one single data source and, thus, incomplete and contains duplicates. We are working on incorporating new open data sources like ORCID to improve the quality and the timeliness of our data. We will update Materials Map as soon as possible and kindly ask for your patience.

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1.080 Topics available

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977 Locations available

693.932 PEOPLE
693.932 People People

693.932 People

Show results for 693.932 people that are selected by your search filters.

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PeopleLocationsStatistics
Naji, M.
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Karadzhinova-Ferrer, Aneliya Georgieva

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Lappeenranta-Lahti University of Technology

in Cooperation with on an Cooperation-Score of 37%

Topics

Publications (7/7 displayed)

  • 2022Characterization of Heavily Irradiated Dielectrics for Pixel Sensors Coupling Insulator Applications1citations
  • 2022Multispectral photon-counting for medical imaging and beam characterization - A project review1citations
  • 2020Processing of AC-coupled n-in-p pixel detectors on MCz silicon using atomic layer deposited aluminium oxide10citations
  • 2019Effects of Defects to the Performance of CdTe Pad Detectors in IBIC Measurements2citations
  • 2019Cadmium Telluride X-ray pad detectors with different passivation dielectrics7citations
  • 2017Advanced processing of CdTe pixel radiation detectors24citations
  • 2014Pixel Detector Upgrade of CMS Experimentcitations

Places of action

Chart of shared publication
Ott, Jennifer
6 / 22 shared
Bharthuar, Shudhashil
3 / 7 shared
Kirschenmann, Stefanie
3 / 6 shared
Mizohata, Kenichiro
1 / 99 shared
Kramarenko, Nikita
2 / 4 shared
Koponen, Pirkitta
3 / 6 shared
Brucken, Jens Erik
4 / 6 shared
Golovleva, Maria
4 / 8 shared
Tuominen, Eija
2 / 8 shared
Härkönen, Jaakko
5 / 10 shared
Luukka, Panja
7 / 14 shared
Bezak, Mihaela
2 / 5 shared
Gädda, Akiko
5 / 12 shared
Kalliokoski, Matti
4 / 8 shared
Winkler, Alexander
3 / 8 shared
Särkkä, Simo
1 / 2 shared
Siiskonen, Teemu
1 / 2 shared
Turpeinen, Raimo
1 / 2 shared
Tikkanen, Joonas Samuli
1 / 2 shared
Karjalainen, Ahti
1 / 2 shared
Petrow, Henri
1 / 2 shared
Emzir, Muhammad
1 / 2 shared
Naaranoja, Tiina Sirea
1 / 1 shared
Litichevskyi, Vladyslav
2 / 3 shared
Härkonen, J.
1 / 2 shared
Golovleva, M.
1 / 7 shared
Martikainen, Laura
1 / 3 shared
Gadda, A.
1 / 3 shared
Vähänen, Sami
2 / 5 shared
Tikkanen, J.
1 / 2 shared
Kalliopuska, Juha
1 / 1 shared
Tuovinen, Esa Veikko
1 / 1 shared
Arsenovich, Tatyana
1 / 3 shared
Mäenpää, Teppo H.
1 / 1 shared
Kassamakov, Ivan Vladislavov
1 / 1 shared
Peltola, Timo
1 / 3 shared
Chart of publication period
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2020
2019
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Co-Authors (by relevance)

  • Ott, Jennifer
  • Bharthuar, Shudhashil
  • Kirschenmann, Stefanie
  • Mizohata, Kenichiro
  • Kramarenko, Nikita
  • Koponen, Pirkitta
  • Brucken, Jens Erik
  • Golovleva, Maria
  • Tuominen, Eija
  • Härkönen, Jaakko
  • Luukka, Panja
  • Bezak, Mihaela
  • Gädda, Akiko
  • Kalliokoski, Matti
  • Winkler, Alexander
  • Särkkä, Simo
  • Siiskonen, Teemu
  • Turpeinen, Raimo
  • Tikkanen, Joonas Samuli
  • Karjalainen, Ahti
  • Petrow, Henri
  • Emzir, Muhammad
  • Naaranoja, Tiina Sirea
  • Litichevskyi, Vladyslav
  • Härkonen, J.
  • Golovleva, M.
  • Martikainen, Laura
  • Gadda, A.
  • Vähänen, Sami
  • Tikkanen, J.
  • Kalliopuska, Juha
  • Tuovinen, Esa Veikko
  • Arsenovich, Tatyana
  • Mäenpää, Teppo H.
  • Kassamakov, Ivan Vladislavov
  • Peltola, Timo
OrganizationsLocationPeople

article

Multispectral photon-counting for medical imaging and beam characterization - A project review

  • Ott, Jennifer
  • Bharthuar, Shudhashil
  • Kalliokoski, Matti
  • Winkler, Alexander
  • Kirschenmann, Stefanie
  • Särkkä, Simo
  • Kramarenko, Nikita
  • Koponen, Pirkitta
  • Brucken, Jens Erik
  • Golovleva, Maria
  • Siiskonen, Teemu
  • Turpeinen, Raimo
  • Tikkanen, Joonas Samuli
  • Karjalainen, Ahti
  • Petrow, Henri
  • Luukka, Panja
  • Bezak, Mihaela
  • Gädda, Akiko
  • Karadzhinova-Ferrer, Aneliya Georgieva
  • Emzir, Muhammad
Abstract

Central focus of the MPMIB project – funded via the Academy of Finland’s RADDESS 2018–2021 programme – has been research towards a next-generation radiation detection system operating in a photon-counting (PC) multispectral mode: The extraction of energy spectrum per detector pixel data will lead to better efficacy in medical imaging with ionizing radiation. Therefore, it can be an important asset for diagnostic imaging and radiotherapy, enabling better diagnostic outcome with lower radiation dose as well as more versatile characterization of the radiation beam, leading for example to more accurate patient dosimetry. We present our approach of fabricating direct-conversion detectors based on cadmium telluride (CdTe) semiconductor material hybridized with PC mode capable application-specific integrated circuits (ASICs), and will give a review on our achievements, challenges and lessons learned. The CdTe crystals were processed at Micronova, Finland’s national research infrastructure for micro- and nanotechnology, employing techniques such as surface passivation via atomic layer deposition, and flip chip bonding of processed sensors to ASIC. Although CdTe has excellent photon radiation absorption properties, it is a brittle material that can include large concentrations of defects. We will therefore also emphasize our quality assessment of CdTe crystals and processed detectors, and present experimental data obtained with prototype detectors in X-ray and Co-60 beams at a standards laboratory

Topics
  • impedance spectroscopy
  • surface
  • extraction
  • semiconductor
  • defect
  • atomic layer deposition
  • dosimetry
  • Cadmium