Materials Map

Discover the materials research landscape. Find experts, partners, networks.

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The Materials Map is an open tool for improving networking and interdisciplinary exchange within materials research. It enables cross-database search for cooperation and network partners and discovering of the research landscape.

The dashboard provides detailed information about the selected scientist, e.g. publications. The dashboard can be filtered and shows the relationship to co-authors in different diagrams. In addition, a link is provided to find contact information.

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Materials Map under construction

The Materials Map is still under development. In its current state, it is only based on one single data source and, thus, incomplete and contains duplicates. We are working on incorporating new open data sources like ORCID to improve the quality and the timeliness of our data. We will update Materials Map as soon as possible and kindly ask for your patience.

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in Cooperation with on an Cooperation-Score of 37%

Topics

Publications (10/10 displayed)

  • 2022Self-Assembled Epitaxial Cathode-Electrolyte Nanocomposites for 3D Microbatteries4citations
  • 2021Lithium-based vertically aligned nanocomposites for three-dimensional solid-state batteries9citations
  • 2020Tailoring Vanadium Dioxide Film Orientation Using Nanosheets: a Combined Microscopy, Diffraction, Transport, and Soft X‐Ray in Transmission Study19citations
  • 2020Tailoring Vanadium Dioxide Film Orientation Using Nanosheets: a Combined Microscopy, Diffraction, Transport, and Soft X‐Ray in Transmission Study19citations
  • 2020Tailoring Vanadium Dioxide Film Orientation Using Nanosheets : a Combined Microscopy, Diffraction, Transport, and Soft X-Ray in Transmission Study19citations
  • 2019Morphology Evolution during Lithium-Based Vertically Aligned Nanocomposite Growth7citations
  • 2016Long-range domain structure and symmetry engineering by interfacial oxygen octahedral coupling at heterostructure interface28citations
  • 2012High-Temperature Magnetic Insulating Phase in Ultrathin La0.67Sr0.33MnO3 Films111citations
  • 2010Suppression of Octahedral Tilts and Associated Changes in Electronic Properties at Epitaxial Oxide Heterostructure Interfacescitations
  • 2007Magnetic effects at the interface between non-magnetic oxides1590citations

Places of action

Chart of shared publication
Verbeeck, Johan
1 / 29 shared
Gauquelin, Nicolas
5 / 43 shared
Cunha, Daniel
3 / 6 shared
Xia, Rui
1 / 1 shared
Rijnders, Guus A. J. H. M.
3 / 3 shared
Verbeek, Xanthe H.
3 / 3 shared
Vaskivskyi, Igor
3 / 5 shared
Koster, Gertjan
5 / 31 shared
Mishra, Shrawan
3 / 4 shared
Smit, Steef
3 / 4 shared
Golden, Mark S.
3 / 3 shared
Popescu, Horia
3 / 4 shared
Araizikanoutas, Georgios
2 / 2 shared
Lumbeeck, Gunnar
3 / 7 shared
Le, Phu Tran Phong
3 / 3 shared
Ten Elshof, Johan E.
3 / 11 shared
Dürr, Hermann A.
2 / 3 shared
Fortuna, Franck
3 / 5 shared
Rana, Abhimanyu
2 / 2 shared
Schüsslerlangeheine, Christian
1 / 1 shared
Hofhuis, Kevin
3 / 4 shared
Hilgenkamp, Hans
4 / 12 shared
Schüßlerlangeheine, Christian
1 / 1 shared
Araizi-Kanoutas, Georgios
1 / 1 shared
Dürr, Hermann
1 / 2 shared
Schuessler-Langeheine, Christian
1 / 3 shared
Singh, Deepak Pratap
1 / 1 shared
Hendriks, Theodoor Anton
1 / 1 shared
Vos, Chris M.
1 / 1 shared
Van Aert, Sandra
1 / 18 shared
Li, Lin
1 / 61 shared
Zhong, Zhicheng
1 / 2 shared
Verbeeck, Jo
1 / 22 shared
Green, Robert J.
1 / 3 shared
Houwman, Evert P.
2 / 3 shared
Macke, Sebastian
1 / 1 shared
Gonnissen, Julie
1 / 2 shared
Liao, Zhaoliang
1 / 2 shared
Rijnders, Guus
3 / 20 shared
Sutarto, Ronny
1 / 3 shared
Sawatzky, George A.
1 / 1 shared
Siemons, Wolter
1 / 1 shared
Blank, Dave Ha
1 / 1 shared
Kautz, Jaap
1 / 1 shared
Boschker, Hans
1 / 2 shared
Burton, John D.
1 / 1 shared
Tsymbal, Evgeny Y.
1 / 6 shared
Oxley, M. P.
1 / 3 shared
Chu, Y. H.
1 / 6 shared
Chang, H. Y.
1 / 1 shared
Yu, P.
1 / 6 shared
Borisevich, A. Y.
1 / 3 shared
Niranjan, Manish K.
1 / 10 shared
Okamoto, S.
1 / 1 shared
Kalinin, Sergei V.
1 / 18 shared
Ramesh, R.
1 / 28 shared
Pennycook, S. J.
1 / 10 shared
Brinkman, Alexander
1 / 4 shared
Blank, David H. A.
1 / 5 shared
Zeitler, U.
1 / 8 shared
Huijben, J.
1 / 1 shared
Zalk, M. Van
1 / 1 shared
Maan, J. C.
1 / 4 shared
Chart of publication period
2022
2021
2020
2019
2016
2012
2010
2007

Co-Authors (by relevance)

  • Verbeeck, Johan
  • Gauquelin, Nicolas
  • Cunha, Daniel
  • Xia, Rui
  • Rijnders, Guus A. J. H. M.
  • Verbeek, Xanthe H.
  • Vaskivskyi, Igor
  • Koster, Gertjan
  • Mishra, Shrawan
  • Smit, Steef
  • Golden, Mark S.
  • Popescu, Horia
  • Araizikanoutas, Georgios
  • Lumbeeck, Gunnar
  • Le, Phu Tran Phong
  • Ten Elshof, Johan E.
  • Dürr, Hermann A.
  • Fortuna, Franck
  • Rana, Abhimanyu
  • Schüsslerlangeheine, Christian
  • Hofhuis, Kevin
  • Hilgenkamp, Hans
  • Schüßlerlangeheine, Christian
  • Araizi-Kanoutas, Georgios
  • Dürr, Hermann
  • Schuessler-Langeheine, Christian
  • Singh, Deepak Pratap
  • Hendriks, Theodoor Anton
  • Vos, Chris M.
  • Van Aert, Sandra
  • Li, Lin
  • Zhong, Zhicheng
  • Verbeeck, Jo
  • Green, Robert J.
  • Houwman, Evert P.
  • Macke, Sebastian
  • Gonnissen, Julie
  • Liao, Zhaoliang
  • Rijnders, Guus
  • Sutarto, Ronny
  • Sawatzky, George A.
  • Siemons, Wolter
  • Blank, Dave Ha
  • Kautz, Jaap
  • Boschker, Hans
  • Burton, John D.
  • Tsymbal, Evgeny Y.
  • Oxley, M. P.
  • Chu, Y. H.
  • Chang, H. Y.
  • Yu, P.
  • Borisevich, A. Y.
  • Niranjan, Manish K.
  • Okamoto, S.
  • Kalinin, Sergei V.
  • Ramesh, R.
  • Pennycook, S. J.
  • Brinkman, Alexander
  • Blank, David H. A.
  • Zeitler, U.
  • Huijben, J.
  • Zalk, M. Van
  • Maan, J. C.
OrganizationsLocationPeople

article

Tailoring Vanadium Dioxide Film Orientation Using Nanosheets: a Combined Microscopy, Diffraction, Transport, and Soft X‐Ray in Transmission Study

  • Rijnders, Guus A. J. H. M.
  • Verbeek, Xanthe H.
  • Vaskivskyi, Igor
  • Koster, Gertjan
  • Mishra, Shrawan
  • Smit, Steef
  • Golden, Mark S.
  • Popescu, Horia
  • Araizikanoutas, Georgios
  • Gauquelin, Nicolas
  • Lumbeeck, Gunnar
  • Huijben, Mark
  • Le, Phu Tran Phong
  • Ten Elshof, Johan E.
  • Schüßlerlangeheine, Christian
  • Dürr, Hermann A.
  • Fortuna, Franck
  • Hofhuis, Kevin
  • Hilgenkamp, Hans
Abstract

<jats:title>Abstract</jats:title><jats:p>Vanadium dioxide (VO<jats:sub>2</jats:sub>) is a much‐discussed material for oxide electronics and neuromorphic computing applications. Here, heteroepitaxy of VO<jats:sub>2</jats:sub> is realized on top of oxide nanosheets that cover either the amorphous silicon dioxide surfaces of Si substrates or X‐ray transparent silicon nitride membranes. The out‐of‐plane orientation of the VO<jats:sub>2</jats:sub> thin films is controlled at will between (011)<jats:sub>M1</jats:sub>/(110)<jats:sub>R</jats:sub> and (−402)<jats:sub>M1</jats:sub>/(002)<jats:sub>R</jats:sub> by coating the bulk substrates with Ti<jats:sub>0.87</jats:sub>O<jats:sub>2</jats:sub> and NbWO<jats:sub>6</jats:sub> nanosheets, respectively, prior to VO<jats:sub>2</jats:sub> growth. Temperature‐dependent X‐ray diffraction and automated crystal orientation mapping in microprobe transmission electron microscope mode (ACOM‐TEM) characterize the high phase purity, the crystallographic and orientational properties of the VO<jats:sub>2</jats:sub> films. Transport measurements and soft X‐ray absorption in transmission are used to probe the VO<jats:sub>2</jats:sub> metal–insulator transition, showing results of a quality equal to those from epitaxial films on bulk single‐crystal substrates. Successful local manipulation of two different VO<jats:sub>2</jats:sub> orientations on a single substrate is demonstrated using VO<jats:sub>2</jats:sub> grown on lithographically patterned lines of Ti<jats:sub>0.87</jats:sub>O<jats:sub>2</jats:sub> and NbWO<jats:sub>6</jats:sub> nanosheets investigated by electron backscatter diffraction. Finally, the excellent suitability of these nanosheet‐templated VO<jats:sub>2</jats:sub> films for advanced lensless imaging of the metal–insulator transition using coherent soft X‐rays is discussed.</jats:p>

Topics
  • impedance spectroscopy
  • surface
  • amorphous
  • phase
  • thin film
  • nitride
  • transmission electron microscopy
  • Silicon
  • electron backscatter diffraction
  • vanadium